Dummy mol removal for performance enhancement

ABSTRACT

The present disclosure relates to an integrated chip. In some embodiments, the integrated chip has a first plurality of source and drain regions disposed within a substrate along a first line extending in a first direction. A plurality of gate structures are arranged over the substrate at a substantially regular pitch, and a plurality of middle-of-the-line (MOL) structures are respectively interleaved between adjacent ones of the plurality of gate structures. The plurality of MOL structures include MOL active structures that are electrically coupled to an overlying conductive interconnect and MOL dummy structures that are not electrically coupled to any overlying conductive interconnect. The plurality of MOL structures are arranged over the first plurality of source and drain regions at an irregular pitch that is larger than the substantially regular pitch.

REFERENCE TO RELATED APPLICATION

This Application is a Continuation of U.S. application Ser. No. 15/148,274, filed on May 6, 2016, the contents of which are hereby incorporated by reference in their entirety.

BACKGROUND

Over the last four decades the semiconductor fabrication industry has been driven by a continual demand for greater performance (e.g., increased processing speed, memory capacity, etc.), a shrinking form factor, extended battery life, and lower cost. In response to this demand, the industry has continually reduced a size of semiconductor device components, such that modern day integrated chips may comprise millions or billions of semiconductor devices arranged on a single semiconductor die.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is noted that, in accordance with the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion.

FIG. 1 illustrates three-dimensional view of some embodiments of a substrate having a middle-of-the-line (MOL) layer arranged at an irregular pitch to reduce parasitic capacitance.

FIG. 2 illustrates a cross-sectional view of some embodiments of a substrate having a MOL layer that is arranged at an irregular pitch to reduce parasitic capacitance.

FIGS. 3A-3B illustrates some embodiments of a NAND gate having a MOL layer that is arranged at an irregular pitch.

FIGS. 4A-4B illustrates some embodiments of a NOR gate having a MOL layer that is arranged at an irregular pitch.

FIG. 5 illustrates a three-dimensional view of some embodiments of a substrate having a MOL layer arranged at an irregular pitch between gate structures within FinFET devices.

FIGS. 6A-6B illustrates some embodiments of a NAND gate having a MOL layer that is arranged at an irregular pitch between gate structures within FinFET devices.

FIGS. 7-11 illustrate top-views and cross-sectional views corresponding to some embodiments of a method of forming an integrated chip having a MOL layer arranged at an irregular pitch.

FIG. 12 illustrates a flow diagram of some embodiments of a method of forming an integrated chip having a MOL layer arranged at an irregular pitch.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, or examples, for implementing different features of the provided subject matter. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. For example, the formation of a first feature over or on a second feature in the description that follows may include embodiments in which the first and second features are formed in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, such that the first and second features may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The apparatus may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein may likewise be interpreted accordingly. Moreover, it will be appreciated that the fill and colors used in the illustrated layers are similar throughout the disclosure (e.g., the fill and color used in the layers shown in FIG. 2 are similar to the fill and colors used in the layers shown in FIGS. 3A-3B).

In emerging technology nodes the small size of transistor components may cause restrictive topology choices for back-end-of-the-line (BEOL) metal layer routing. To alleviate the metal line routing problems, middle-of-the-line (MOL) local interconnection layers may be used. MOL local interconnect layers are conductive metal layers that are vertically positioned between the front-end-of-line (FEOL) and the BEOL. MOL local interconnect layers can provide very high-density local routing that avoids consumption of scarce routing resources on the lower BEOL metal layers.

Typically, MOL local interconnect layers comprise MOL structures that are formed over a well region at a constant (i.e., regular) pitch to improve a lithographic process window. Conductive contacts are subsequently formed onto some of the MOL structures that are needed in a design to form an electrical connection with overlying metal wire layers. This results in dummy MOL structures, which are the MOL structures that have no electrical connection to overlying metal wire layers. It has been appreciated that in emerging technology nodes (e.g., 14 nm, 10 nm, 7 nm, etc.) the small size between MOL structures and gate structures is becoming small enough to produce a parasitic capacitance that significantly degrades transistor device performance.

The present disclosure relates to a method of forming an integrated chip that removes unnecessary MOL dummy structures to reduce parasitic capacitance and to form MOL structures at an irregular pitch, and an associated apparatus. In some embodiments, the integrated chip comprises a well region comprising a plurality of source/drain regions. A plurality of gate structures are arranged over the well region at a regular pitch. A plurality of middle-of-the-line (MOL) structures are laterally interleaved between some of the plurality of gate structures and are arranged over the well region at an irregular pitch comprising a first pitch that is larger than the regular pitch. By having the MOL structures arranged at an irregular pitch that comprises a first pitch that is larger than the regular pitch, one or more of the plurality of gate structures are spaced apart from a closest gate or MOL structure by a relatively large space that provides for a relatively low parasitic capacitance.

FIG. 1 illustrates three-dimensional view of some embodiments of an integrated chip 100 having a middle-of-the-line (MOL) layer arranged at an irregular pitch to reduce parasitic capacitance.

The integrated chip 100 comprises a well region 103 comprising a plurality of source/drain regions 104 (to simplify the illustration, a single source/drain region 104 is labeled with a reference numeral in FIG. 1.) arranged within the semiconductor substrate 102 along a first direction 116. In some embodiments, the well region 103 may have a doping type opposite the source/drain regions 104 (e.g., a PMOS active area formed within a p-type substrate may comprise p-type source/drain regions arranged within an n-type well region 103). The plurality of source/drain regions 104 comprise highly doped regions (e.g., having a doping concentration greater than that of the surrounding semiconductor substrate 102) that are laterally separated by channel regions 105. A plurality of gate structures 106 are arranged over the channel regions 105 and extend over the well region 103 along a second direction 118 that is perpendicular to the first direction 116. The plurality of gate structures 106 are arranged in a repeating pattern that extends along the first direction 116. Within the repeating pattern, the plurality of gate structures 106 are arranged at a regular pitch 110 (i.e., a spacing is substantially the same between left edges of the gate structures or between right edges of the gate structure).

A plurality of middle-of-the-line (MOL) structures 108 are arranged over the well region 103 at locations between adjacent ones of the plurality of gate structures 106. The plurality of MOL structures 108 are in electrical contact with the source/drain regions 104 and are configured to provide for lateral routing (e.g., in the first direction 116 and/or the second direction 118) between the source/drain regions 104 and an overlying conductive contact (not shown). Two or more of the plurality of MOL structures 108 are arranged over the well region 103 at a pitch 112 larger than the regular pitch 110.

Since the pitch 112 is larger than the regular pitch 110, at least two adjacent ones of the plurality of MOL structures 108 are laterally separated by a second distance greater than the regular pitch. However, since the plurality of gate structures 106 are arranged at the regular pitch, this means that some of the plurality of gate structures 106 are not separated by an intervening MOL structure. By having some of the plurality of gate structures 106 not separated by a MOL structure 108, the parasitic capacitance on the gate structures 106 is reduced. Reducing the parasitic capacitance (e.g., an unwanted capacitance between conductive components because of their proximity to one another) on the gate structures 106 improves performance of transistors associated with the gate structures 106.

It will be appreciated that the term “regular pitch”, as used herein, means a substantially regular pitch within tolerances due to misalignment errors. For example, the regular pitch may have values between different pairs of gate structures that vary due to misalignment errors by approximately 5% (e.g., a first pitch Pa of a first pair of gate structures may be between 0.95 and 1.05 times a second pitch Pb of a second pair of gate structures).

FIG. 2 illustrates a cross-sectional view of some embodiments of an integrated chip 200 having MOL structures arranged at an irregular pitch. With respect to the embodiment of FIG. 1, like elements in the cross-sectional view 200 are designated with the same reference numbers for ease of understanding.

The integrated chip 200 comprises a well region 103 arranged within a semiconductor substrate 102. The well region 103 comprises a plurality of source/drain regions 104 that are laterally separated by channel regions 105. A plurality of gate structures 106 are arranged over the channel regions 105 at a regular pitch 110. In some embodiments, the plurality of gate structures 106 may respectively comprise a gate electrode 204 separated from the semiconductor substrate 102 by way of a gate dielectric 202. In various embodiments, the gate electrode 204 may comprise polysilicon or a metal (e.g., aluminum). In various embodiments, the gate dielectric 202 may comprise an oxide (e.g., silicon dioxide) or a high-k material.

A plurality of MOL structures 108 are arranged over source/drain regions 104 at a location laterally adjacent to the gate structures 106. The plurality of MOL structures 108 may contact the underlying semiconductor substrate 102. In various embodiments, the plurality of MOL structures 108 may comprise a conductive metal (e.g., tungsten, copper, cobalt, etc.). In some embodiments, the plurality of gate structures 106 and the plurality of MOL structures 108 may have an approximately same height h.

The plurality of MOL structures 108 are arranged at an irregular pitch having more than one pitch. For example, a first MOL structure 108 a and a second MOL structure 108 b may be arranged at a first pitch 206, while the second MOL structure 108 b and a third MOL structure 108 c may be arranged at a second pitch 208 that is different than the first pitch 206. The irregular pitch causes different ones of the plurality of MOL structures 108 to be separated from an adjacent one of the plurality of MOL structures 108 by different spaces, and also causes a gate structure 106 to be separated from adjacent MOL or gate structures by different spaces. For example, a gate structure 106 may have a first side separated from a neighboring MOL structure 108 by a first distance s₁ and an opposite second side that is separated from an adjacent gate structure 106 by a second distance s₂ that is larger than the first distance s₁. Since capacitance (C) is inversely proportional to a distance (d) between conductive elements (e.g., C∝1/d), the larger second distance s₂ reduces the parasitic capacitance on the gate structures 106 and improves performance of transistors associated with the gate structures 106.

The irregular pitch also causes one or more of the plurality of gate structures 106 to laterally neighbor a MOL structure 108 and a gate structure 106 on opposing sides. In other words, the one or more MOL structures 108 are laterally interleaved between a subset of the plurality of gate structures 106, so that the plurality of gate structures 106 and the one or more MOL structures 108 are arranged over the well region 103 in a pattern in which two or more of the plurality of gate structures 106 neighbor each other (i.e., are not separated by an interleaved MOL structure 108).

A first inter-level dielectric (ILD) layer 210 a is arranged over the semiconductor substrate 102 at locations laterally between the plurality of gate structures 106 and the plurality of MOL structures 108. A second ILD layer 210 b is arranged over the first ILD layer 210 a. A plurality of conductive contacts 214 are arranged within the second ILD layer 210 b at locations over the plurality of MOL structures 108. The plurality of conductive contacts 214 are configured to electrically couple the plurality of MOL structures 108 to an overlying metal wire layer 216 arranged within a third ILD layer 210 c overlying the second ILD layer 210 b. In some embodiments, the first ILD layer 210 a may be vertically separated from the second ILD layer 210 b by a first etch stop layer 212 a, and the second ILD layer 210 b may be vertically separated from the third ILD layer 212 c by a second etch stop layer 212 b.

In some embodiments, the conductive contacts 214 may comprise tungsten and the overlying metal wire layer 216 may comprise copper. In some embodiments, all of the plurality of MOL structures 108 over the well region 103 are electrically coupled to a conductive contact 214. In various embodiments, the ILD layers 210 a-210 c may comprise a low-k dielectric layer, an ultra low-k dielectric layer, an extreme low-k dielectric layer, and/or a silicon dioxide layer. In various embodiments, the etch stop layers 212 a-212 b may comprise a nitride, such as silicon nitride, for example.

FIG. 3A illustrates a top-view 300 of some embodiments of a NAND gate having a MOL layer arranged at an irregular pitch. FIG. 3B illustrates a corresponding schematic diagram 314 of the NAND gate of FIG. 3A.

As shown in top-view 300, the NAND gate comprises a first well region 302 and a second well region 312. The first well region 302 comprises a plurality of source/drain regions having p-type dopants. The second well region 312 comprises a plurality of source/drain regions having n-type dopants.

A first gate structure 304 a and a second gate structure 304 b extend over the first well region 302 to form a first PMOS transistor T1 and a second PMOS transistor T2 arranged in parallel between a node ZN and a source voltage V_(DD). A first plurality of MOL structures 306 a-306 c are arranged over the first well region 302 at a first pitch p₁ that causes the gate structures 304 a-304 b to be separated from the first plurality of MOL structures 306 a-306 c on opposing sides by an equal space.

The first plurality of MOL structures comprise a first MOL structure 306 a, a second MOL structure 306 b, and a third MOL structure 306 c. The first MOL structure 306 a and the second MOL structure 306 b extend from over the first well region 302 to under a first metal wire structure 308 a (illustrated as transparent to show the underlying layers). The first MOL structure 306 a and the second MOL structure 306 b are connected to the first metal wire structure 308 a by way of conductive contacts 310 (to simplify the illustration, a single conductive contact 310 is labeled with a reference numeral in FIGS. 3A-3B). The third MOL structure 306 c is connected to a second metal wire structure 308 b by a conductive contact 310.

The first gate structure 304 a and the second gate structure 304 b also extend over the second well region 312 to form a first NMOS transistor T3 and a second NMOS transistor T4 arranged in series between node ZN and a ground voltage V_(SS). A second plurality of MOL structures 306 d-306 e are arranged over the second well region 312 at a second pitch p₂ that is greater than the first pitch p₁, and which causes the gate structures 304 a-304 b to be separated from the second plurality of MOL structures 306 d-306 e on opposing sides by unequal spaces.

The second plurality of MOL structures 306 d-306 e comprise a fourth MOL structure 306 d and a fifth MOL structure 306 e. The fourth MOL structure 306 d extends from over the second well region 312 to under a third overlying metal wire structure 308 c and is connected to the third overlying metal wire structure 308 c by way of a conductive contact 310. The fifth MOL structure 306 e is connected to a fourth overlying metal wire structure 308 d by a conductive contact 310.

FIG. 4A illustrates a top-view 400 of some embodiments of a NOR gate having a MOL layer arranged at an irregular pitch. FIG. 4B illustrates a corresponding schematic diagram 414 of the NOR gate of FIG. 4A.

As shown in top-view 400, the NOR gate comprises a first well region 402 and a second well region 412. The first well region 402 comprises a plurality of source/drain regions having n-type dopants. The second well region 412 comprises a plurality of source/drain regions having p-type dopants.

A first gate structure 404 a and a second gate structure 404 b extend over the first well region 402 to form a first PMOS transistor T1 and a second PMOS transistor T2 arranged in series between a node ZN and a source voltage V_(DD). A first plurality of MOL structures 406 a-406 b are arranged over the first well region 402 at a first pitch p₁′ that causes the gate structures 404 a-404 b to be separated from the first plurality of MOL structures 406 a-406 b on opposing sides by unequal spaces.

The first plurality of MOL structures comprise a first MOL structure 406 a and a second MOL structure 406 b. The first MOL structure 406 a extends from over the first well region 402 to under a first metal wire structure 408 a (illustrated as transparent to show the underlying layers). The first MOL structure 406 a is connected to the first metal wire structure 408 a by a conductive contact 410 (to simplify the illustration, a single conductive contact 410 is labeled with a reference numeral in FIGS. 3A-3B). The second MOL structure 406 b is connected to a second metal wire structure 408 b by way of a conductive contact 410.

The first gate structure 404 a and the second gate structure 404 b also extend over the second well region 412 to form a first NMOS transistor T3 and a second NMOS transistor T4 arranged in parallel between node ZN and a ground voltage V_(SS). A second plurality of MOL structures 406 c-406 e are arranged over the second well region 412 at a second pitch p₂′ that is less than the first pitch p₁′, and which causes the gate structures 404 a-404 b to be separated from the second plurality of MOL structures 406 c-406 e on opposing sides by an equal space.

The second plurality of MOL structures 406 c-406 e comprise a third MOL structure 406 c, a fourth MOL structure 406 d, and a fifth MOL structure 406 e. The third MOL structure 406 c and the fourth MOL structure 406 d extend from over the second well region 412 to under a third overlying metal wire 408 c and are connected to the third MOL structure 406 c by way of conductive contacts 410. The fifth MOL structure 406 e is connected to a fourth overlying metal wire structure 408 d by a conductive contact 410.

It has been appreciated that the use of a MOL layer having an irregular pitch may be especially useful in multi-gate device (e.g., double gate FinFETs, tri-gate FinFETs, omega FET, Gate all around (GAA), vertical GAA, etc.). FIG. 5 illustrates three-dimensional view of some embodiments of an integrated chip 500 having a MOL layer arranged at an irregular pitch between gate structures of multi-gate devices (e.g., a FinFET devices). Elements in the three-dimensional view of FIG. 5 that are described in previous embodiments have been designated with the same reference numbers for ease of understanding.

The integrated chip 500 comprises a plurality of fins of semiconductor material 502 protruding outward from a semiconductor substrate 102 (e.g., from a well region 103 doped opposite the semiconductor substrate 102) and extending along a first direction 116. The plurality of fins of semiconductor material 502 extend between epitaxial source/drain regions 504 (to simplify the illustration, a single source/drain region 504 is labeled with a reference numeral in FIG. 5). The epitaxial source/drain regions 504 are shared between adjacent fins of semiconductor material 502 (e.g., so that a same epitaxial source/drain region 504 extends between a first fin and a second fin). The epitaxial source/drain regions 504 are arranged on the fins of semiconductor material 502 and comprise highly doped regions of semiconductor material (e.g., having a doping concentration greater than that of the semiconductor substrate 102), so that a channel region may be formed within the plurality of fins of semiconductor material 502. In some embodiments, the plurality of fins of semiconductor material 502 may be laterally separated by an isolation layer 501 (e.g., comprising STI regions).

A plurality of gate structures 506 are arranged over the plurality of fins of semiconductor material 502 along a second direction 118 that is perpendicular to the first direction 116 (to simplify the illustration, a single gate structure 506 is labeled with a reference numeral in FIG. 5). The plurality of gate structures 506 are arranged in a repeating pattern that extends along the first direction 116. Within the repeating pattern, the plurality of gate structures 506 are arranged at a regular pitch 110.

A plurality of middle-of-the-line (MOL) structures 508 are arranged over the plurality of fins of semiconductor material 502 at locations between adjacent ones of the plurality of gate structures 506 (to simplify the illustration, a single MOL structure 508 is labeled with a reference numeral in FIG. 5). In some embodiments, the plurality of MOL structures 508 may be arranged onto an insulating layer (not shown) surrounding the plurality of fins of semiconductor material 502. The plurality of MOL structures 508 are in electrical contact with the plurality of source/drain regions 504 and are configured to provide for lateral routing to an overlying conductive contact 510 (to simplify the illustration, a single conductive contact 510 is labeled with a reference numeral in FIG. 5). Two or more of the plurality of MOL structures 508 are arranged at a pitch 112 larger than the regular pitch 110.

FIG. 6A illustrates a top-view 600 of some embodiments of a NAND gate having a MOL layer arranged at an irregular pitch between gate structures within FinFET devices. FIG. 6B illustrates a corresponding schematic diagram 614 of the NAND gate of FIG. 6A.

As shown in top-view 600, the NAND gate comprises a first well region 602 and a second well region 612. The first well region 602 comprises first and second fins of semiconductor material, 603 a and 603 b, arranged between source and drain regions (not shown) having p-type dopants. The second well region 612 comprises first and second fins of semiconductor material, 613 a and 613 b, arranged between source and drain regions (not shown) having n-type dopants.

A first gate structure 604 a and a second gate structure 604 b extend over the first well region 602 to form a first PMOS transistor T1 and a second PMOS transistor T2 arranged in parallel between a node ZN and a source voltage V_(DD). A first plurality of MOL structures 606 a-606 c are arranged over the first well region 602 at a first pitch p₁ that causes the gate structures 604 a-604 b to be separated from MOL structures 606 a-606 c on opposing sides by an equal space. The first gate structure 604 a and the second gate structure 604 b also extend over the second well region 612 to form a first NMOS transistor T3 and a second NMOS transistor T4 arranged in series between node ZN and a ground voltage V_(SS). A second plurality of MOL structures 606 d-606 e are arranged over the second well region 612 at a second pitch p₂ that is greater than the first pitch p₁, and which causes the gate structures 604 a-604 b to be separated from MOL structures 606 d-606 e on opposing sides by unequal spaces.

FIGS. 7-11 illustrates top-views and corresponding cross-sectional views corresponding to some embodiments of a method of forming an integrated chip that reduces parasitic capacitance by removing unnecessary MOL dummy structures. It will be appreciated that elements in FIGS. 7-11 that have been described in previous embodiments have been designated with the same reference numbers for ease of understanding. Furthermore, to simplify the illustrations, elements shown multiple times within a figure are labeled with a reference numeral a single time (e.g., although multiple gate structures are shown in FIGS. 7-11, a single gate structure 106 is labeled).

As shown in top-view 700 and cross-sectional view 706 of FIG. 7 a plurality of gate structures 106 are formed over a semiconductor substrate 102 at a regular pitch 110. The plurality of gate structures 106 comprise a gate electrode 204 separated from the semiconductor substrate 102 by a gate dielectric layer 202. An well region 103 comprising a plurality of source/drain regions 104 is also formed within the semiconductor substrate 102. In some embodiments, the well region 103 (within which the source/drain regions 104 are disposed) is formed prior to the formation of the plurality of gate structures 106. The well region may be formed by selectively implanting a dopant species into the semiconductor substrate 103 (e.g., an n-well may be formed within a p-type substrate, to form a PMOS active area, by implanting a p-type dopant into the substrate prior to the formation of the gate structures).

In various embodiments, the semiconductor substrate 102 may comprise any type of semiconductor body (e.g., silicon/CMOS bulk, SiGe, SOI, etc.) such as a semiconductor wafer or one or more die on a wafer, as well as any other type of semiconductor and/or epitaxial layers formed thereon and/or otherwise associated therewith. In some embodiments, the plurality of gate structures 106 may be formed by forming a gate dielectric layer over the semiconductor substrate 102, and subsequently forming a gate electrode layer over the gate dielectric layer. The gate dielectric layer and the gate electrode layer are subsequently patterned according to photolithography process to form a plurality of gate structures 106.

In some embodiments, the plurality of source/drain regions 104 may be formed by an implantation process that implants a dopant species 708 into the semiconductor substrate 102. In various embodiments, the dopant species 708 may comprise a p-type dopant (e.g., boron, gallium, etc.) or an n-type dopant (e.g., phosphorus, arsenic, etc.). In some embodiments, the dopant species 708 may be driven into the semiconductor substrate 102 by performing a subsequent high-temperature anneal. In some alternative embodiments, the source/drain regions 104 may be formed by an epitaxial growth process at a location within or overlying the semiconductor substrate 102.

As shown in top-view 800 and cross-sectional view 804 of FIG. 8, a plurality of MOL structures, 802 a and 802 b, are formed over the semiconductor substrate 102 at locations laterally interleaved between the plurality of gate structures 106. The plurality of MOL structures comprise MOL active structures 802 a (i.e., MOL structures that are subsequently connected to an overlying conductive contact within an electrical path) and MOL dummy structures 802 b (i.e., electrically inactive MOL structures that are not subsequently connected to an overlying conductive contact). The plurality of MOL structures, 802 a and 802 b, are arranged at a first pitch 206. In some embodiments, the regular pitch 110 and the first pitch 206 are substantially equal.

As shown in top-view 900 and cross-sectional view 904 of FIG. 9, a cut mask 902 is used in a patterning process that selectively removes parts of the MOL structures, 802 a and/or 802 b. In some embodiments, the patterning process patterns a masking layer 906 overlying the semiconductor substrate 102 to form openings 908 within the masking layer 906 that arranged over the MOL dummy structures 802 b. In some embodiments, the masking layer 906 may comprise a photoresist layer. In such embodiments, the masking layer 906 may be patterned by selectively exposing the masking layer 906 to radiation 910 according to the cut mask 902, and subsequently developing the masking layer 906 to form the openings 908.

In some embodiments, the location of cut regions 901 within the cut mask 902 may be limited by design rules. For example, in some embodiments, the cut mask 902 may not be able to remove MOL dummy structures 802 b that are separated by an insufficient spacing (e.g., if the spacing between edges of the cuts is smaller than that allowed by design rules). In such embodiments, the cut mask 902 may be configured to remove a part of a MOL dummy structure 802 b that is allowed by design rules. For example, as shown in boxes 912 of top-view 900, MOL dummy structures 802 b are aligned so that the cut mask 902 would have cuts that are separated by a space that is smaller than that allowed by design rules. Therefore, a part of the MOL dummy structures 802 b is removed, and a reminder of the MOL dummy structures 802 b is left. By removing a part of the MOL dummy structures 802 b, the parasitic capacitance of the design is reduced without violating design rules that may lead to high cost mask construction.

As shown in top-view 1000 and cross-sectional view 1002 of FIG. 10, an etching process is used to selectively remove the MOL dummy structures 802 b according to the openings 908 in the masking layer 906. The etching process exposes the MOL dummy structures 802 b underlying the openings 908 to an etchant 1004, which selectively cuts or trims the MOL dummy structures 802 b over some parts of the well region 103. In some embodiments, the etchant 1004 may be selective to a material of the MOL structures, 802 a and 802 b, so that the gate structure 106 is not cut. In various embodiments, the etchant 1004 may comprise a dry etchant (e.g., a plasma etch with tetrafluoromethane (CF₄), sulfur hexafluoride (SF₆), nitrogen trifluoride (NF₃), etc.) or a wet etchant (e.g., hydroflouric (HF) acid).

The etching process causes the plurality of MOL structures, 802 a and 802 b, overlying the well region 103 to have an irregular pitch. The irregular pitch causes some of the plurality of MOL structures, 802 a and 802 b, to be arranged at the first pitch 206, while others of the plurality of MOL structures, 802 a and 802 b, are arranged at a second pitch 208 that is larger than the first pitch 206.

While FIGS. 9-10 illustrate the use of a ‘cut last’ technique that cuts the MOL dummy structures 802 b, it will be appreciated that other cut techniques may be used. For example, in some alternative embodiments, a ‘cut first’ technique may be used to form a material on cut regions so that the MOL dummy structures 802 b will be excluded from being formed in the cut regions.

As shown in cross-sectional view 1100 and cross-sectional view 1102 of FIG. 11, an ILD layer 1104 is formed over the semiconductor substrate 102. The ILD layer 1104 laterally separates the gate structures 106 and the MOL structures 108. Conductive contacts 214 are subsequently formed in the ILD layer 1104. The conductive contacts 214 electrically connect the MOL structures 108 to an overlying metal wire layer 216 arranged in an overlying ILD layer 1106.

In some embodiments, the ILD layer 1104 may be deposited over the semiconductor substrate 102 by way of vapor deposition techniques (e.g., physical vapor deposition, chemical vapor deposition, etc.). The ILD layer 1104 is selectively etched to form a contact hole extending from an upper surface of the ILD layer 1104 and the MOL structure 108. The contact hole is then filled with a metal (e.g., tungsten), and a first planarization process is performed to form a conductive contact 214. In some embodiments, the overlying metal wire layer 216 may be formed by depositing the overlying ILD layer 1106 over the ILD layer 1104 using a vapor deposition process. The overlying ILD layer 1106 is selectively etched to form a trench, which is subsequently filled with a metal (e.g., copper). A second planarization process may be subsequently performed to form the overlying metal wire layer 216.

FIG. 12 illustrates a flow diagram of some embodiments of a method 1200 of forming an integrated chip that reduces parasitic capacitance by removing unnecessary MOL dummy structures to form MOL structures at an irregular pitch.

While the disclosed method 1200 is illustrated and described herein as a series of acts or events, it will be appreciated that the illustrated ordering of such acts or events are not to be interpreted in a limiting sense. For example, some acts may occur in different orders and/or concurrently with other acts or events apart from those illustrated and/or described herein. In addition, not all illustrated acts may be required to implement one or more aspects or embodiments of the description herein. Further, one or more of the acts depicted herein may be carried out in one or more separate acts and/or phases.

At 1202, a plurality of fins of semiconductor material may be formed to protrude from a semiconductor substrate in some embodiments.

At 1204, a plurality of gate structures are formed over the semiconductor substrate at a regular pitch. In some embodiments, the plurality of gate structures may be formed over the plurality of fins of semiconductor material. In other embodiments, the plurality of gate structures may be formed on a planar surface of the semiconductor substrate. FIG. 7 illustrates some embodiments corresponding to act 1204.

At 1206, a well region is formed. The well region comprises a plurality of source/drain regions. The well region may extend along a direction that intersects the plurality of gate structures. FIG. 7 illustrates some embodiments corresponding to act 1206.

At 1208, an original MOL layer is formed having a plurality of MOL structures overlying the well region and interleaved between the plurality of gate structures at a first pitch. FIG. 8 illustrates some embodiments corresponding to act 1208.

At 1210, part of the original MOL layer overlying the well region is removed to form a modified MOL layer having an irregular pitch. The irregular pitch may comprise the first pitch, and a second pitch that is larger than the first pitch. FIGS. 9-10 illustrate some embodiments corresponding to act 1210.

At 1212, conductive contacts are formed on one or more MOL structures overlying the well region. FIG. 11 illustrates some embodiments corresponding to act 1212.

Therefore, the present disclosure relates to a method of forming integrated chip that reduces parasitic capacitance by removing unnecessary MOL dummy structures to form MOL structures at an irregular pitch, and an associated apparatus.

In some embodiments, the present disclosure relates to an integrated chip. The integrated chip comprises a well region comprising a plurality of source/drain regions, and a plurality of gate structures arranged over the well region at a substantially regular pitch. The integrated chip comprises a plurality of middle-of-the-line (MOL) structures laterally interleaved between some of the plurality of gate structures and arranged over the well region at an irregular pitch comprising a first pitch that is larger than the substantially regular pitch.

In other embodiments, the present disclosure relates to an integrated chip. The integrated chip comprises a well region having a plurality of source/drain regions. The integrated chip further comprises a plurality of gate structures arranged over the well region and laterally separated from one another by a first distance, and a plurality of middle-of-the-line (MOL) structures arranged over the well region at positions laterally interleaved between two of the plurality of gate structures. At least two adjacent ones of the plurality of MOL structures are laterally separated by a second distance greater than the first distance.

In yet other embodiments, the present disclosure relates to a method of forming an integrated chip. The method comprises forming a plurality of gate structures over a semiconductor substrate, and forming a well region comprising a plurality of source/drain regions, wherein the well region underlies the plurality of gate structures. The method further comprises forming an original middle-of-the-line (MOL) layer having a plurality of MOL structures laterally interleaved between the plurality of gate structures and overlying the well region. The method further comprises removing a part of the original MOL layer overlying the well region to form a modified MOL layer.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand the aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they may make various changes, substitutions, and alterations herein without departing from the spirit and scope of the present disclosure. 

What is claimed is:
 1. An integrated chip, comprising: a first plurality of source and drain regions disposed within a substrate along a first line extending in a first direction; a plurality of gate structures arranged over the substrate at a substantially regular pitch; a plurality of middle-of-the-line (MOL) structures respectively interleaved between adjacent ones of the plurality of gate structures; wherein the plurality of MOL structures comprise MOL active structures that are electrically coupled to an overlying conductive interconnect and MOL dummy structures that are not electrically coupled to any overlying conductive interconnect; and wherein the plurality of MOL active structures are arranged over the first plurality of source and drain regions at an irregular pitch that is larger than the substantially regular pitch.
 2. The integrated chip of claim 1, further comprising: a plurality of vias disposed within an inter-level dielectric (ILD) layer and contacting the MOL active structures, wherein the plurality of vias have sidewalls continuously extending between a bottom of the ILD layer and a top of the ILD layer.
 3. The integrated chip of claim 1, further comprising: a second plurality of source and drain regions disposed within the substrate along a second line extending in the first direction, the first line separated from the second line along a second direction perpendicular to the first direction; and wherein the plurality of gate structures comprise a first gate structure extending in the second direction over the first line and the second line.
 4. The integrated chip of claim 3, wherein the MOL dummy structures comprise a first MOL dummy structure extending over the first line in the second direction; and wherein the first MOL dummy structure is not aligned in the second direction with a MOL dummy structure extending over the second line.
 5. The integrated chip of claim 1, wherein the plurality of MOL structures comprise: a first MOL dummy structure having a first length measured along a second direction that is perpendicular to the first direction; and a closest neighboring MOL structure having a second length measured along the second direction, the second length greater than the first length.
 6. The integrated chip of claim 1, wherein the MOL dummy structures comprise a first MOL dummy structure having a first length measured along a second direction that is perpendicular to the first direction; and wherein the MOL active structures comprise a first MOL active structure having a second length measured along the second direction, the second length greater than the first length.
 7. The integrated chip of claim 1, further comprising: a plurality of fins of semiconductor material protruding outward from an upper surface of the substrate and extending along the first direction between the first plurality of source and drain regions; and wherein the plurality of gate structures straddle the plurality of fins of semiconductor material and contact the upper surface or the substrate.
 8. The integrated chip of claim 7, wherein the plurality of MOL structures have bottom surfaces that are separated from the upper surface of the substrate by a non-zero distance.
 9. The integrated chip of claim 1, further comprising: a first inter-level dielectric (ILD) layer over the substrate and laterally between adjacent ones of the plurality of MOL structures; and an etch stop layer contacting upper surfaces of the plurality of MOL structures and the first ILD layer.
 10. An integrated chip, comprising: a plurality of source and drain regions within a substrate; a plurality of gate structures arranged over the substrate at a substantially regular pitch in a first direction; a plurality of middle-of-the-line (MOL) active structures contacting one or more of the source and drain regions and having a substantially same height as the plurality of gate structures, wherein the plurality of MOL active structures are arranged at an irregular pitch that is larger than the substantially regular pitch; a first inter-level dielectric (ILD) layer over the substrate and laterally between adjacent ones of the plurality of MOL active structures; an etch stop layer having a lower surface directly contacting upper surfaces of the plurality of MOL active structures and the first ILD layer, wherein the etch stop layer contacts the first ILD layer along an interface that continually extends between adjacent ones of the plurality of gate structures; and a plurality of conductive contacts arranged on the plurality of MOL active structures and surrounded by a second ILD layer, wherein the plurality of conductive contacts are respectively coupled to an overlying conductive wire.
 11. The integrated chip of claim 10, wherein the lower surface of the etch stop layer is unbroken between the adjacent ones of the plurality of gate structures.
 12. The integrated chip of claim 10, wherein the plurality of conductive contacts have sidewalls defined by a differentiable function that continuously extends between a bottom of the second ILD layer and a top of the second ILD layer.
 13. The integrated chip of claim 10, further comprising: a plurality of MOL dummy structures contacting the substrate, wherein the plurality of MOL dummy structures are not electrically coupled to any overlying conductive interconnect.
 14. The integrated chip of claim 13, wherein the plurality of MOL dummy structures comprise a first MOL dummy structure that is arranged between adjacent ones of the plurality of gate structures along the first direction.
 15. The integrated chip of claim 10, further comprising: a plurality of MOL dummy structures contacting the substrate, wherein the plurality of MOL dummy structures are completely covered by the etch stop layer.
 16. The integrated chip of claim 10, further comprising: a plurality of MOL dummy structures contacting the substrate, wherein the plurality of MOL dummy structures are completely covered by the second ILD layer.
 17. A method of forming an integrated chip, comprising: forming a plurality of gate structures over a substrate; forming a plurality of source and drain regions along opposing sides of the plurality of gate structures; defining a plurality of middle-of-the-line (MOL) structures at locations laterally interleaved between the plurality of gate structures; and redefining the plurality of MOL structures to remove a part but not all of one or more of the plurality of MOL structures.
 18. The method of claim 17, wherein the plurality of MOL structures are defined according to a first patterning process that uses a first photomask, and wherein the plurality of MOL structures are redefined according to a second patterning process that uses a cut mask.
 19. The method of claim 17, wherein the plurality of middle-of-the-line (MOL) structures comprise MOL active structures and MOL dummy structures; and wherein redefining the plurality of MOL structures removes a part but not all of a first one of the MOL dummy structures.
 20. The method of claim 17, wherein redefining the plurality of MOL structures forms two separate MOL segments from a single one of the plurality of MOL structures. 